Wednesday, 25 November 2009
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Carl V. Thompson
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Conference Papers
2000 - Present
1990 - 1999
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Presentations
Electromigration Circuits
Bonded Cu Interconnects
Stresses in Nanocrystalline
Abnormal Grain Growth
Carbon Nanotube Interconnects
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2008 - Present
2000 - 2007
1990 - 1999
Pre 1990
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Research Topics
Carbon Nanotube Growth
Catalyst Engineering
Surface Electromigration
Polycrystalline Metallic Films
Nano-particle Formation
Silicon Nanowire
Active Atomic Sinks
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C. V. Thompson Presentations
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Electromigration in Integrated Circuits: Nano-Scale Processes Affecting the Reliability of Kilometer
02/23/2009
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Bonded Cu Interconnects for Three-Dimensional Circuits
02/23/2009
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The Origin and Control of Residual Stresses in Nanocrystalline Thin Films: The Roles of Stress Relax
02/23/2009
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Texture Development and Abnormal Grain Growth in Thin Films
02/23/2009
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Carbon Nanotube Interconnects?
02/23/2009
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Presentations C. V. Thompson Presentations
Presentations C. V. Thompson Presentations
Presentations C. V. Thompson Presentations
