Wednesday, 25 November 2009
  • Home
    • Contact Us
    • Site Map
    • Login
  • People
    • Carl V. Thompson
      • Biography
      • Courses
    • Kathleen Fitzgerald
    • Ahmed Al-Obeidi
    • Shih-Wei Chang
    • Amanda Giermann
    • Qiang Guo
    • Dr. Donghyun Kim
    • Prashanth Makaram
    • Robert Mitchell
    • Gilbert D. Nessim
    • Jihun Oh
    • Yong Cheol Shin
    • Dr. Yang Wang
    • Hang Yu
  • Conference Papers
    • 2000 - Present
    • 1990 - 1999
    • Pre 1990
    • Journal Reprint Request
  • Presentations
    • Electromigration Circuits
    • Bonded Cu Interconnects
    • Stresses in Nanocrystalline
    • Abnormal Grain Growth
    • Carbon Nanotube Interconnects
  • Publications
    • 2008 - Present
    • 2000 - 2007
    • 1990 - 1999
    • Pre 1990
    • Journal Reprint Request
  • Research Topics
    • Carbon Nanotube Growth
    • Catalyst Engineering
    • Surface Electromigration
    • Polycrystalline Metallic Films
    • Nano-particle Formation
    • Silicon Nanowire
    • Active Atomic Sinks
  • Web Links

 
Materials for Micro and Nano Systems

Home Research Topics
Research Topics

icon Carbon Nanotube Growth for I.C. Interconnects

icon Catalyst Engineering and Growth Mechanisms of Si and III-V Nanowires

icon Effects of Active Atomic Sinks and Reservoirs on the Reliability of Cu/low-k Interconnects

icon Grain Structure and Residual Stress in Polycrystalline Metallic Films

icon Nano-particle Formation via Solid-state Dewetting

icon Silicon Nanowire Fabrication by Metal-assisted Etching

icon Surface Electromigration, Void Dynamics, and the Reliability of IC Interconnects

 

 
 
Banner
Copyright © 2009 Materials for Micro and Nano Systems. All Rights Reserved.
77 Massachusetts Avenue, Cambridge, MA 02139